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1Structured illumination microscopy for super-resolution and optical sectioning显示文摘Optical microscopy plays an essential role in biological studies due to its capability and compatibility of non-contact,minimally invasive observation and measurement of live specimens.However,the conventional optical microscopy only has a spatial resolution about200 nm due to the Abbe diffraction limit,and also lacks the ability of three-dimensional imaging.Super-resolution farfield optical microscopy based on special illumination schemes has been dramatically developed over the last decade.Among them,only the structured illumination microscopy(SIM)is of wide-field geometry that enables it easily compatible with the conventional optical microscope.In this article,the principle of SIM was introduced in terms of point spread function(PSF)and optical transform function(OTF)of the optical system.The SIM for super-resolution(SIM-SR)proposed by Gustafsson et al.and the SIM for optical sectioning(SIM-OS)proposed by Neil et al.are the most popular ones in the research community of microscopy.They have the same optical configuration,but with different data postprocessing algorithms.We mathematically described the basic theories for both of the SIMs,respectively,and presented some numerical simulations to show the effects of super-resolution and optical sectioning.Various approaches to generation of structured illumination patterns were reviewed.As an example,a SIM system based on DMDmodulation and LED-illumination was demonstrated.A lateral resolution of 90 nm was achieved with gold nanoparticles.The optical sectioning capability of the microscope was demonstrated with Golgi-stained mouse brain neurons,and the sectioning strength of 930 nm was obtained.Dan Dan Baoli Yao Ming Lei 2014Chinese Science Bulletin2014,59,12:14
2基于TeO_2旋光特性对声光可调滤波器消色散的设计显示文摘该文研究了晶体外的衍射角随入射光波长以及入射光极角的变化趋势,并在考虑晶体的旋光特性的条件下对其进行研究,明确晶体旋光特性对衍射角的具体影响;在考虑晶体旋光特性的情况下,在晶体的出射面添加光楔,有效地消除了由于晶体色散而引起的图像漂移,提高了声光可调滤波器在光谱成像中的成像分辨率;最后对所添加的光楔进行优化设计,达到消除色散的最佳状态.任玉 蔡红星 谭勇 郑峰 张喜和 2011中国科学:物理学、力学、天文学2011,41,8:1
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