Yield Stability and Late Blight Resistance Analysis among Potato Clones Bred with Quantitative Resistance

查看全文 作　　者：Theophile [1]Ndacyayisenga;Geofrey [2]Tusiimet;Paul [2]Gibson;Rogers [3]Kakuhenzire 机构地区：[1]Rwanda Agriculture Board, Crop Research and Extension, Kigali 5016, Rwanda;[2]Department of Crop Science, Makerere University, Kampala 7062, Uganda;[3]International Potato Center, Kampala 222 74, Uganda 出　　处：《Journal of Agricultural Science and Technology(B)》索引2014年第4卷第9期,共8页 关 键 词：国际马铃薯中心 稳定性分析 晚疫病抗性 产量低 克隆 育成 种植季节 方差分析