Minority carrier lifetime evaluation of periphery edge region in high-performance multicrystalline ingot produced by seed-assisted directional solidification

查看全文 作　　者：Zhong [1]Li;Jia-Dan [2]Li;Lin [2]Zhuang;Rui-Jiang [2]Hong

机构地区：[1]College of Physics and Electronic Information Engineering, Qinghai Nationalities University, Xining 810007, China;[2]Guangdong Provincial Key Laboratory of Photovoltaic Technology, School of Physics, Sun Yat-sen University, Guangzhou 510006, China

出　　处：《Frontiers of physics》索引2017年第12卷第5期,共7页

关键词：少数载流子寿命多晶硅锭边缘区域定向凝固寿命评价种子性能傅立叶变换红外光谱

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Minority carrier lifetime evaluation of periphery edge region in high-performance multicrystalline ingot produced by seed-assisted directional solidification

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