Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

查看全文 作　　者：[1]朱云龙;Julien [1,2]Vaillant;Guillaume [2]Montay;Manuel Fran?[2]ois;Yassine [1]Hadjar;Aurélien [1]Bruyant

机构地区：[1]ICD-L2N, UMR CNRS 6281, Université de Technologie de Troyes;[2]ICD-LASMIS, UMR CNRS 6281, Université de Technologie de Troyes

出　　处：《Chinese Optics Letters》索引2018年第16卷第7期,共5页

基　　金：financially supported by the ANR Micromorfing Program(ANR-14-CE07-0035);China Scholarship Council(CSC);the Labex Action 摘　　要：Electronic speckle pattern interferometry(ESPI) and digital speckle pattern interferometry are wellestablished non-contact measurement methods. They have been widely used to carry out precise deformation mapping. However, the simultaneous two-dimensional(2D) or three-dimensional(3D) deformation measurements using ESPI with phase shifting usually involve complicated and slow equipment. In this Letter, we solve these issues by proposing a modified ESPI system based on double phase modulations with only one laser and one camera. In-plane normal and shear strains are obtained with good quality. This system can also be developed to measure 3D deformation, and it has the potential to carry out faster measurements with a highspeed camera. 关键词：测量方法点缀电子调整飞机 2D ESPI 照相机

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Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

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