Determination of interface layer thickness of a pseudo two—phase system by extension of the Debye equation

查看全文 作　　者：[1]ZhiHongLi;[2]YanJunGong;[2]MinPu;[2]DongWu;[2]YuHanSun;[2]JunWang;[2]YiLiu;[2]BaoZh 机构地区：[1]StateKeyLaboratoryofCoalConversion,InstituteofCoalChemistry,ChineseAcademyofSciences,POBox165,Taiyuan030001,People’sRepublicofchina;[2]SynchrotronRadiationLaboratory,InstituteofHighEnergyPhysics,Chinese 出　　处：《Beijing Synchrotron Radiation Facility》索引2001年第2期,共4页 摘　　要：The Debye equation with slit-smeared small angle x-ray scattering(SAXS) data is extended form an ideal two-phase system to a pseudo two-phase system with the presence of the interface layer,and a simple accurate solution is proposed to determine the average thickness of the interface layer in porous materials.This method is tested by experimental SAXS data,which were measured at 25℃,of organo-modified mesoporous silica prepared by condensation of tetraethoxysiland(TEOS) and methyltriethoxysilane(MTES) using non-ionic neutral surfactant as template under neutral condition. 关 键 词：扩展德拜方程式 假两相体系 界面层厚度 SAXS 小角X射线散射分析 中孔硅石 中孔渗水