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38篇 您的检索式:期刊名="Microeletron"
    题名 作者 年代 出处 被引量
1GaN nanorod assemblies on self-implanted ( 111 ) Si substrates 显示文摘Seo H W Chen Q Y Tu L W 2006Microeletron Engineering2006,83,:1
2A statistical distribution function of wide applicability显示文摘Weibull W 1951Journal of Applied Microeletron Reliability1951,28,4:1
3New XOR/XNOR and full adder circuits for low voltage显示文摘LEE H SOBELMAN G 1998Low Power Applications Microeletronics Journal1998,29,8:1
4A model for residual life prediction based on Brownian motion with an adaptive drift显示文摘WANG Wenbin Carr M XU Wenjia 2010Microeletronics Reliability2010,51,2:1
5Numerical analysis on the LDMOS with a double epi-layer and trench electrodes 显示文摘PARK I-Y CHOI Y-I CHUNG S-K 2001Microeletronics J2001,32,56:1
6Thermal properties of diamond/ copper composite material显示文摘Yoshida K Morigami H 2004Microeletronics Reliability2004,44,:1
7Electron transport in ultrathin double-gate SOI devices显示文摘Gamiz F Roldan J B Lopez-Villanueva J A 2001Microeletronic Engineering2001,59,3:1
8Development of Gold to Gold Interconnection Flip Chip Bonding for Chip On Suspension Assemblies 显示文摘Luk C F Chan Y C Hung K C 2002Microeletronics reliability2002,,12:1
9Innovative Advances in LED Technology显示文摘YAM F K HASSAN Z 2005Microeletron2005,136,2:1
10Development of gold to gold interconnection flip chip bonding for chip on suspension assemblies 显示文摘Luk C F Chan Y C Hung K C 2002Microeletronics reliability2002,,12:1
11Laser processing for microelectronics packaging applications显示文摘Zsolt I V 2001Microeletronics Reliability2001,41,4:1
12Some Advancement in the Analysis of Two Unit Parallel Redundant System显示文摘Linton D G 1976Microeletron Reliab1976,15,:1
13Mechanical-Thermal Noise in Micromachined Gyros显示文摘Annovazzi-Lodi V Merlo S 1999Microeletronics Journal1999,30,:1
14Reliability and Availability Analysis for Two Non-identical Unit Parallel Systems with Common Cause Failures and Human Errors显示文摘Sridharan V Mohanavadivu P 1997Microeletron Reliab1997,37,5:1
15Robotic Systems Probabilistic Analysis显示文摘DHILLON B S FASHANDI A R M 1997Microeletron Relib1997,37,2:1
16Reliability and MTTF evaluation of a repairable complex system under waiting显示文摘Gupta P P Arvind Kumar 1987Microeletron Reliab1987,27,3:1
17A Method to Solve Fuzzy Reliability Optimization Problem显示文摘Utkin Lev V Gurov Sergey V Shubinsky Igor B 1995Microeletron Re- liab1995,35,2:1
18Some advancement in the analysis of two unit parallel redundant system显示文摘Linton D G 1976Microeletron Reliab1976,15,:1
19Thermal challenges in MEMS applicatons:phase change phenomena and thermal bonding processes显示文摘LIN Liwei 2003Microeletronics Journal2003,34,:1
20Nanostmctures for chemical recognition using ISFET sensors显示文摘JIMENEZ C ROCHEFEUILE S SETA P 2004Microeletronics J2004,35,1:1
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