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18篇 您的检索式：作者名="Eryurek"

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		题名	作者	年代	出处	被引量
	1	Neural networks for sensor validation and plant wide monitoring显示文摘	Eryurek E Turkcan E	1992	Nuclear Europe Worldscan1992，12，1：	1
	2	Application of Neural Net- works for Sensor Validationand Plant Monitoring显示文摘	Upadhyaya B Eryurek E	1992	Nuclear Technology1992，97，：	1
	3	Sensor validation for power plants using adaptive backpropagation neural network显示文摘	E Eryurek B R Upadhyaya	1990	IEEE TRANSACTIONS ON NUCLEAR SCIENCE1990，37，：	1
	4	Fault-tolerant control and diagnostics for large-scale systems 显示文摘	Eryurek E Upadhyaya B R	1995	IEEE Control Systems Magazine1995，15，5：	1
	5	Effect of fracture toughness on abrasive wear resistance of steels显示文摘	I. Sevim I.B. Eryurek	2005	Materials and Design2005，，10：	1
	6	Effect of fracture toughness on abrasive wear resistance of steels显示文摘	Sevim I Eryurek 1	2006	Materials and Design2006，27，10：	1
	7	Effect of fracture toughness on abrasive wear resistance of steels显示文摘	Sevim I Eryurek I B	2006	Materials&design2006，27，10：	1
	8	Effect of fracture toughness on ab- rasive wear resistance of steels 显示文摘	Sevim I Eryurek I B	2005	Materials and De- sign2005，27，10：	1
	9	Effect of abrasive particle size on wear resistance in steels 显示文摘	Sevim I Eryurek I B	2006	Materials and Design2006，27，3：	1
	10	Effect of ti'acture toughness on abrasive wear re- sistance of steels 显示文摘	Sevim I Eryurek I	2006	Materials and Design2006，，27：	1
	11	Fault tolerant control and diagnostic for large scale systems显示文摘	ERYUREK E UPADHYAYA B R	1995	IEEE Cont Syst Mag1995，15，5：	1
	12	Application of neural networks for sensor validation and plant monitoring显示文摘	UPADHYAYA B R ERYUREK E	1992	Nuclear Technology1992，，97：	1
	13	Optical properties and Judd-Ofelt analysis of Nd2O3 nanocrystals embedded in polymethyl methacrylate显示文摘PMMA matrices were doped with nano-crystalline neodymium oxides synthesized by thermal decomposition process. X-ray diffraction and high-resolution transmission electron microscopy measurements were carried out to investigate the structure, phase, and the morphology of the Nd_2O_3 nanocrystals and those embedded in the PMMA matrix. The average grain sizes were estimated 35 ± 6 nm and 46 ± 4 nm for non-annealed and annealed Nd_2O_3 particles, respectively. The grain size distributions(GSD) were calculated from the diffraction peaks of the annealed and non-annealed Nd_2O_3 powders and doped PMMA samples. The mass density, refractive index. UV-Visible absorption spectra were measured and the data were analyzed using the Judd-Ofelt approach to determine the oscillator strengths, the spontaneous emission probabilities and the branching ratios as a function of the nano-crystalline Nd_2O_3 content in the range of 0.1 wt.%-20 wt.% of MMA. Luminescence spectra upon 808 nm diode laser excitation were carried out in the wavelength range of 850-1550 nm at room temperature. The photoluminescence study has shown that the reasonably sharp emission peaks were observed upon heat treatment at 800 ℃ for 24 h for all concentrations of Nd_2O_3 nanopowders in PMMA. The infrared laser transition of Nd^(3+) ions at about 1.06 μm due to the ~4F_(3/2)→~4I_(11/2) transition was analyzed and discussed in Nd_2O_3 system for their possible applications in the photonic technology.	Sevcan Tabanli Gokhan Bilir Gonul Eryurek	2018	Journal of Rare Earths2018，36，2：	1
	14	Sensor validation for power plants using adaptive backpropagation neural network显示文摘	Eryurek E Upadhyaya B R	1990	IEEE transaction on nuclear science1990，37，2：	1
	15	Failure Analysis of an Elevator Drive Shaft 显示文摘	Goksenli A Eryurek I B	2009	Engineering Failure Analysis2009，16，4：	1
	16	Gamma-glutamyl transpeptidase and acetylcholinesterase activities in brain capillaries of cholesterol-fed rabbits显示文摘	Eryurek FG Surmen E Oner P	1990	Res Commun Chem Pathol Pharmacol1990，69，2：	1
	17	Sensor validation for power plants using adaptive backpropagation neural network显示文摘	Eryurek E Upadhyaya B R	1990	IEEE Transaction on Nuclear Science1990，37，2：	1
	18	Fault-tolerant control and diagnosis for large-scale systems 显示文摘	Eryurek E Upadhyaya B R	1995	IEEE Control Systems1995，3442，：	1

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