维普中文期刊产品整合服务
1篇 您的检索式:作者名="Graham Antoszewski"
    题名 作者 年代 出处 被引量
1Unsupervised phase mapping of X-ray diffraction data by nonnegative matrix factorization integrated with custom clustering显示文摘Analyzing large X-ray diffraction(XRD)datasets is a key step in high-throughput mapping of the compositional phase diagrams of combinatorial materials libraries.Optimizing and automating this task can help accelerate the process of discovery of materials with novel and desirable properties.Here,we report a new method for pattern analysis and phase extraction of XRD datasets.The method expands the Nonnegative Matrix Factorization method,which has been used previously to analyze such datasets,by combining it with custom clustering and cross-correlation algorithms.This new method is capable of robust determination of the number of basis patterns present in the data which,in turn,enables straightforward identification of any possible peak-shifted patterns.Peak-shifting arises due to continuous change in the lattice constants as a function of composition and is ubiquitous in XRD datasets from composition spread libraries.Successful identification of the peak-shifted patterns allows proper quantification and classification of the basis XRD patterns,which is necessary in order to decipher the contribution of each unique single-phase structure to the multi-phase regions.The process can be utilized to determine accurately the compositional phase diagram of a system under study.The presented method is applied to one synthetic and one experimental dataset and demonstrates robust accuracy and identification abilities.Valentin Stanev Velimir V.Vesselinov A.Gilad Kusne Graham Antoszewski Ichiro Takeuchi Boian S.Alexandrov 2018npj Computational Materials2018,,1:5
返回顶部 每页显示:
共1页 首页 上一页 第1页 下一页 末页 /1 跳转

网站首页 | 关于我们 | 联系我们 | 产品服务 | 客服中心 | 广告服务 | 版权声明 | 网站联盟 | 友情链接 | 售卡网点

版权所有© 渝B2-20050021-1 渝公网安备 50019002500403号 违法和不良信息举报中心

互联网出版许可证 新出网证(渝)字10号 全国400电话 - 免长途话费