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8篇 您的检索式:作者名="H R Manjunath"
    题名 作者 年代 出处 被引量
1柑桔黄龙病的鉴定和柯赫氏定理(英文)显示文摘黄龙(梢)病被认为是世界柑橘生产上的毁灭性病害已超过一个世纪,但该病害的病原学至今还没有清晰地建立起来。根据16S rRNA基因序列分析,一组被称为'Candidatus Liberibacter species'的难培养细菌被认为与黄龙病相关。然而,要确定'Ca.Liberibacter spp.'是黄龙病病原的柯赫氏定理并没有真正完成。令我们担忧的是,近年来有些文献频频指出'Ca.Liberibacter spp.'是黄龙病的病原,其实该细菌与柑橘寄主的直接病理反应还没有完全确定。我们建议,在黄龙病病原学清楚之前,文献报道在这方面需要有准确的阐述。Chen J Deng X Civerolo E L Lee R F Jones J B Zhou C Hartung J S Manjunath K L Brlansky R H 2011植物病理学报2011,41,2:10
2Growth profile based crop yield models: a case study of large area wheat yield modeling and its extendibility using atmospheric corrected NOAAAVHRR data显示文摘Kalubarme M H Potdar M B Manjunath K R 2003International Joumal ofRemoteSensing2003,234,10:1
3Molecular characterization of a structural epitope that is largely conserved among severe isolates of a plant vlrus显示文摘Pappu H R Pappu S S Manjunath K L 1993Proc Nad Acad Sci1993,90,:1
4Growth profile based crop yield models:a case of large area wheat yield modelling and its extendibility using atmospheric corrected NOAA AVHRR data显示文摘Kalubarme M H Potdar M B Manjunath K R 2003International Journal of Remote Sensing2003,24,10:1
5Growth profile based crop yield models: a case study of large area wheat yield modeling and its extendibility using atmospheric corrected NOAA AVHRR data显示文摘Kalubarme M H Potdar M B Manjunath K R 2003International Journal of Remote Sensing2003,234,10:1
6Grouth Profile Based Crop Yield Models:a Case Study of Large Area Wheat Yield Modeling and Its Extendibility Using Atmospheric Corrected NOAA AVHRR Data显示文摘Kalubarme M H Potdar M B Manjunath K R 2003International Journl of Remote Sensing2003,234,10:1
7Growth profile based crop yield models: a case study of large area wheat yield modelling and its extendibility using atmospheric corrected NOAA AVHRR data显示文摘Kalubarme M H Potdar M B Manjunath K R 2003International Journal of Remote Sensing2003,24,10:1
8Experimental and modeling studies of a Brillouin amplifier 显示文摘Allan A Offenberger David C Thompson Robert Fedosejevs J Santiago H R Manjunath 1993IEEE J Ouantum Electron1993,29,1:1
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