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14篇 您的检索式：作者名="KOUVATSOS D D"

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		题名	作者	年代	出处	被引量
	1	Charging effects in silicon nanocrystals embedded in SiO2films显示文摘	KOUVATSOS D N IOANNOU-SOUGLERIDIS V NASSIOPOULOU A G	2003	Materials Science and Engineering:B2003，101，123：	1
	2	Content distribution over IP: developments and challenges显示文摘	POPESCU A KOUVATSOS D D REMONDO D	2011	Network Performance Engineering2011，5233，：	1
	3	Micro-electronic Engineering显示文摘	Kouvatsos D N Ioannou-Sougleridis V Tsevas S	2003	70(2-4):5012003，70，24：	1
	4	Microelec-tronic Engineering显示文摘	Tsevas S Vasilopoulou M Kouvatsos D N	2006	83(4-9):14342006，83，49：	1
	5	Analysis of GSM/GPRS cell with multiple data sin-dee classes 显示文摘	Begaln J K Awang I Kouvatsos D D	2003	Wireless Personal Communications2003，，1：	1
	6	Influence of polysilicon film thickness on radiation response of advanced exciter laser annealed polycrystalline silicon thin film transistors 显示文摘	Davidovic V Kouvatsos D N Stojadinovic N	2007	Microelectronics Reliability2007，47，91011：	1
	7	Entropy maximisation and open queueing networks with priorities and blocking显示文摘	Kouvatsos D Awan I	2003	Performance Evaluation2003，51，2：	1
	8	Mem for arbitrary queueing networks with multiple general servers and repetitive service blocking显示文摘	Kouvatsos D Xenios N	1988	Performance Evaluation1988，39，2：	1
	9	Characteristics of MOS diodes fabricated using sputter-depositod W or Cu/W films 显示文摘	TSEVAS S VASILOPOULOU M KOUVATSOS D N SPELIOTIS T NIARCHOS D	2006	Microelectronic Engineering2006，83，：	1
	10	Stochastic analysis of deterministic routing algorithms in the presence of self-similar traffic显示文摘	Min G Y Duldkhaoua M Kouvatsos D D	2006	The Journal of Supercomputing2006，35，3：	1
	11	Charging effects in silicon nanocrystals within SiOz layers fabricated by chemical vapor deposition, oxidation, and annealing显示文摘	Photopoulos P Nassiopoulou A G Kouvatsos D N	2000	Applied Physics Letters2000，76，24：	1
	12	A distributed reputation and trust management scheme for mobile peer-to-peer networks显示文摘	Qureshi B Min G Kouvatsos D	2012	Computer Communications2012，35，5：	1
	13	Characteristics of MOS diodes fabricated using sputter 2 deposited W or Cu/W films 显示文摘	TSEVASS S VASILOPOULOU M KOUVATSOS D N	2006	Microelee- tronic Engineering2006，83，：	1
	14	Charging effects in silicon nanocrystals within SiO2 layers, fabricated by chemical vapor deposition, oxidation, and annealing 显示文摘	KOUVATSOS D N IOANNOU-SOUGLERIDIS V NASSIOPOULOU A G	2003	Applied Physics Letters2003，82，3：	1

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