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27篇 您的检索式：作者名="Kleyner"

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	题名	作者	年代	出处	被引量
1	Application of Petri nets to reliability prediction of occupant safety systems with partial detection and repair显示文摘	Andre Kleyner VitaliVolovoi	2010	Reliability Engineering and System Safety2010，95，6：	1
2	Bayesian techniques to reduce the sample size in automotive electronics attribute testing 显示文摘	Kleyner A Bhagath S Gasparini M	1997	Microelectronics Reliability1997，37，6：	1
3	Bayesian techniques to reduce the sample size in automotive electronics attribute testing显示文摘	Kleyner A	1997	Microelectron Reliab1997，37，6：	1
4	Bayesian Techniques to Reduce the Sample Size in Automotive Electronics Attribute Testing显示文摘	Kleyner A	1997	Microelectron Reliab1997，37，6：	1
5	Bayesian techniques to reduce the sample size in automotive electronics attribute testing显示文摘	Kleyner A	1997	Microelectron Reliab1997，37，6：	1
6	Bayesian techniques to reduce the sample size in au- tomotive electronics attribute testing显示文摘	Kleyner A	1997	Microelectronic Reli- ability1997，37，6：	1
7	Bayesian techniques to reduce t he sample size in automotive electronics attribute testing显示文摘	Kleyner A Bhagath S Gasparini M	1997	Microlectron Re liab1997，9，6：	1
8	Bayesian techniques to reduce the sample size in automotive electronics attribute testing显示文摘	Kleyner A	1997	Microelectronics Reliability1997，37，6：	1
9	Bayesian techniques to reduce the sample size in automotive electronics attribute testing显示文摘	Kleyner A	1997	Microelection Reliab1997，37，6：	1
10	Bayesian techniques to reduce the sample size in automotive electronics attribute testing 显示文摘	KLEYNER A	1997	Micro- electron Reliab1997，37，6：	1
11	A novel mechanism for mitogen-activated protein kinase localization 显示文摘	Bind E Kleyner Y Skowronska-Krawczyk D	2004	Mol Biol Cell2004，15，10：	1
12	Bayesian Techniques to Reduce the Sample Size in Auto- motive Electronics Attribute Testing显示文摘	Kleyner Andre Bhagath Shrikar Gasparini Mauro	1997	Micrlectronics Reliability1997，37，6：	1
13	A warranty forecasting model based on piecewise statistical distributions and stochastic simulation 显示文摘	Kleyner A Sandborn P	2005	Reliability Engineering and System Safety2005，88，：	1
14	Bayesian tech- niques to reduce the sample size in automotive electronics at- tribute testing显示文摘	Kleyner A Bhagath S Gasparini M	1997	Microeletronics Reliability1997，37，6：	1
15	Bayesian techniques to reduce the sample size in automotive electronics attribute testing显示文摘	Kleyner A	1997	Microelectronics Reliability1997，37，6：	1
16	Bayesian techniques to reduce the sample size in automotive electronics attribute testing 显示文摘	Kleyner A	1997	Microelectronis Reliability1997，37，6：	1
17	Bayesian techniques to reduce the sample size in automotive electronics attribute testing显示文摘	Kleyner A Bhagath S Gasparini M	1997	Microelectronics Reliability1997，37，6：	1
18	The Lunar Reconnaissance Orbiter Laser Ranging Investigation显示文摘	Maria T. Zuber David E. Smith Ronald S. Zellar Gregory A. Neumann Xiaoli Sun Richard B. Katz Igor Kleyner Adam Matuszeski Jan F. McGarry Melanie N. Ott Luis A. Ramos-Izquierdo David D. Rowlands Mark H. Torrence Thomas W. Zagwodzki	2010	Space Science Reviews (-)2010，，1：	1
19	The Lunar Orbiter Laser Altimeter Investigation on?the?Lunar Reconnaissance Orbiter Mission显示文摘	David E. Smith Maria T. Zuber Glenn B. Jackson John F. Cavanaugh Gregory A. Neumann Haris Riris Xiaoli Sun Ronald S. Zellar Craig Coltharp Joseph Connelly Richard B. Katz Igor Kleyner Peter Liiva Adam Matuszeski Erwan M. Mazarico Jan F. McGarry Anne-Marie	2010	Space Science Reviews (-)2010，，1：	1
20	Bayesain techniques to reduce the sample size in automotive electronics attribution testing显示文摘		1977	Microelectron Reliab1977，37，6：	1

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