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| 1 | Effect of Ni Content on Mechanical Properties and Corrosion Behavior of Al/Sn-9Zn-xNi/Cu Joints显示文摘The effects of Ni content on the microstructure and the wetting behavior of Sn-9Zn-xNi solders on Al and Cu substrates, as well as the mechanical properties and electrochemical corrosion behavior of Al/Sn-9Zn-xNi/Cu solder joints, were investigated. The microstructure of Sn-9Zn-xNi revealed that tiny Zn and coarsened Ni 5 Zn 21 phases dispersed in the β-Sn matrix. The wettability of Sn-9Zn-xNi solders on Al substrate was much better than that on Cu substrate. With increasing Ni content, the wettability on Cu substrate was slightly improved but became worse on Al substrate. In the Al/Sn-9Zn-xNi/Cu joints, an Al4.2Cu3.2Zn0.7 intermetallic compound (IMC) layer formed at the Sn-9Zn-xNi/Cu interfaces, while an Al-Zn-Sn solid solution layer formed at the Sn-9Zn-xNi/Al interface. The mixed compounds of Ni3Sn4 and Al3Ni dispersed in the solder matrix and coarsened with increasing Ni content, thus leading to a reduction in shear strength of the Al/Sn-9Zn-xNi/Cu joints. Al particles were segregated at both interfaces in the solder joints. The corrosion potentials of Sn-9Zn-xNi solders continuously increased with increasing Ni content. The Al/Sn-9Zn-0.25Ni/Cu joint was found to have the best electrochemical corrosion resistance in 5% NaCl solution. | M.L.Huang N.Kang Q.Zhou Y.Z.Huang | 2012 | Journal of Materials Science & Technology2012，28，9： | 10 |
| 2 | Solder Size Effect on Early Stage Interfacial Intermetallic Compound Evolution in Wetting Reaction of Sn3.0Ag0.5Cu/ENEPIG Joints显示文摘Solder size effect on early stage interfacial intermetallic compound(IMC) evolution in wetting reaction between Sne3.0Age0.5Cu solder balls and electroless nickel electroless palladium immersion gold(ENEPIG) pads at 250 C was investigated. The interfacial IMCs transformed from initial needle- and rodtype(Cu,Ni)6Sn5to dodecahedron-type(Cu,Ni)6Sn5and then to needle-type(Ni,Cu)3Sn4at the early interfacial reaction stage. Moreover, these IMC transformations occurred earlier in the smaller solder joints, where the decreasing rate of Cu concentration was faster due to the Cu consumption by the formation of interfacial(Cu,Ni)6Sn5. On thermodynamics, the decrease of Cu concentration in liquid solder changed the phase equilibrium at the interface and thus resulted in the evolution of interfacial IMCs; on kinetics, larger solder joints had sufficient Cu flux toward the interface to feed the(Cu,Ni)6Sn5growth in contrast to smaller solder joints, thus resulted in the delayed IMC transformation and the formation of larger dodecahedron-type(Cu,Ni)6Sn5grains. In smaller solders, no spalling but the consumption of(Cu,Ni)6Sn5grains by the formation of(Ni,Cu)3Sn4grains occurred where smaller discrete(Cu,Ni)6Sn5grains formed at the interface. | M.L.Huang F.Yang | 2015 | Journal of Materials Science & Technology2015，31，3： | 2 |
| 3 | Different Diffusion Behavior of Cu and Ni Undergoing Liquidesolid Electromigration显示文摘The diffusion behavior of Cu and Ni atoms undergoing liquidesolid electromigration(L-S EM) was investigated using Cu/Sn/Ni interconnects under a current density of 5.0 103A/cm2 at 250℃. The flowing direction of electrons significantly influences the cross-solder interaction of Cu and Ni atoms, i.e., under downwind diffusion, both Cu and Ni atoms can diffuse to the opposite interfaces; while under upwind diffusion,Cu atoms but not Ni atoms can diffuse to the opposite interface. When electrons flow from the Cu to the Ni, only Cu atoms diffuse to the opposite anode Ni interface, resulting in the transformation of interfacial intermetallic compound(IMC) from Ni3Sn4into(Cu,Ni)6Sn5and further into [(Cu,Ni)6Sn5t Cu6Sn5], while no Ni atoms diffuse to the opposite cathode Cu interface and thus the interfacial Cu6Sn5 remained.When electrons flow from the Ni to the Cu, both Cu and Ni atoms diffuse to the opposite interfaces,resulting in the interfacial IMC transformation from initial Cu6Sn5into(Cu,Ni)6Sn5and further into[(Cu,Ni)6Sn5t(Ni,Cu)3Sn4] at the anode Cu interface while that from initial Ni3Sn4into(Cu,Ni)6Sn5and further into(Ni,Cu)3Sn4at the cathode Ni interface. It is more damaging with electrons flowing from the Cu to the Ni than the other way. | M.L.Huang Z.J.Zhang H.T.Ma L.D.Chen | 2014 | Journal of Materials Science & Technology2014，30，12： | 1 |
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