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您的检索式：作者名="Nathan J.Szymanski"
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| 1 | Validating neural networks for spectroscopic classification on a universal synthetic dataset显示文摘To aid the development of machine learning models for automated spectroscopic data classification,we created a universal synthetic dataset for the validation of their performance.The dataset mimics the characteristic appearance of experimental measurements from techniques such as X-ray diffraction,nuclear magnetic resonance,and Raman spectroscopy among others.We applied eight neural network architectures to classify artificial spectra,evaluating their ability to handle common experimental artifacts.While all models achieved over 98%accuracy on the synthetic dataset,misclassifications occurred when spectra had overlapping peaks or intensities.We found that non-linear activation functions,specifically ReLU in the fully-connected layers,were crucial for distinguishing between these classes,while adding more sophisticated components,such as residual blocks or normalization layers,provided no performance benefit.Based on these findings,we summarize key design principles for neural networks in spectroscopic data classification and publicly share all scripts used in this study. | Jan Schuetzke Nathan J.Szymanski Markus Reischl | 2023 | npj Computational Materials2023，，1： | 0 |
| 2 | Adaptively driven X-ray diffraction guided by machine learning for autonomous phase identification显示文摘Machine learning(ML)has become a valuable tool to assist and improve materials characterization,enabling automated interpretation of experimental results with techniques such as X-ray diffraction(XRD)and electron microscopy.Because ML models are fast once trained,there is a key opportunity to bring interpretation in-line with experiments and make on-the-fly decisions to achieve optimal measurement effectiveness,which creates broad opportunities for rapid learning and information extraction from experiments.Here,we demonstrate such a capability with the development of autonomous and adaptive XRD.By coupling an ML algorithm with a physical diffractometer,this method integrates diffraction and analysis such that early experimental information is leveraged to steer measurements toward features that improve the confidence of a model trained to identify crystalline phases.We validate the effectiveness of an adaptive approach by showing that ML-driven XRD can accurately detect trace amounts of materials in multi-phase mixtures with short measurement times.The improved speed of phase detection also enables in situ identification of short-lived intermediate phases formed during solid-state reactions using a standard in-house diffractometer.Our findings showcase the advantages of in-line ML for materials characterization and point to the possibility of more general approaches for adaptive experimentation. | Nathan J.Szymanski Christopher J.Bartel Yan Zeng Mouhamad Diallo Haegyeom Kim Gerbrand Ceder | 2023 | npj Computational Materials2023，，1： | 0 |
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