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13篇 您的检索式：作者名="PALAIS O"

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		题名	作者	年代	出处	被引量
	1	One-year monitoring of core biomarker and digestive enzyme responses in transplanted zebra mussels(Dreissena polymorpha)显示文摘	Palais F Dedourge-Geffard O Beaudon A	2012	Ecotoxicology2012，21，：	1
	2	Fiber coupling using graded-index rod lenses显示文摘	Palais J O	1980	Applied Optics1980，19，12：	1
	3	Minority carrier li- fetime and metallic-impurity mapping in silicon wafers 显示文摘	Palais O Martinuzzi S Simon J J	2001	Materials Science in Semiconductor Processing2001，4，13：	1
	4	Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers显示文摘	Palais O Yakimov E Martinuzzi S	2002	Materials Science and Engineering2002，9192，：	1
	5	Minority carrier lifetime scan maps applied to iron concentration mapping in silicon wafers Materials 显示文摘	Palais O Yakimov E Martinuzzi S	2002	Materials Science and Engineering: B2002，9192，：	1
	6	Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps显示文摘	Hidalgo P Palais O Martinuzzi S	2004	J Phys Condens Matter2004，16，：	1
	7	Segregation phenomena in large-size cast multicrystalline Si ingots显示文摘	Martinuzzi S Perichaud I Palais O	2007	Solar Energy Mater Solar Cells2007，，91：	1
	8	Segregation phenomena in large-size cast multicrystalline Si ingots显示文摘	MARTINUZZI S PE′RICHAUD I PALAIS O	2007	Solar Energy Materials and Solar Cells2007，91，13：	1
	9	Influence of ironcontamination on the performances of single-crystalline silicon solarcells: computed and experimental results 显示文摘	DUBOIS S PALAIS O PASQUINELLI M	2006	J Appl Phys2006，100，02：	1
	10	Scanning tech- niques applied to the eharacterisation of P and N type multicrys- taUine silicon显示文摘	MART1NUZZI S PALAIS O OSTAPENKO S	2006	Materials Science in Semiconductor Processing2006，9，1：	1
	11	Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless life- time scan maps显示文摘	Idalgo P H Palais O Artinuzzi S M	2004	J Phys Condens Matter2004，16，：	1
	12	Contactless measurement of bulk life-time and surface recombination velocity in silicon wafers显示文摘	Palais O Arcari A	2003	Journal of Applied Physics2003，93，8：	1
	13	Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps显示文摘	Hidalgo P Palais O Martinuzzi S	2004	Condens Matter2004，16，2：	1

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