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		题名	作者	年代	出处	被引量
	1	THICKNESS-DEPENDENCE OF RESIDUAL STRESS IN LEAD-FREE FERROELECTRIC K_(0.5)Na_(0.5)NbO_(3) FILMS显示文摘Lead-free ferroelectric K_(0.5)Na_(0.5)NbO_(3)(KNN)films with different thicknesses were prepared by polyvinlypyrrolidone(PVP)-modified chemical solution deposition(CSD)method.Their residual stresses were studied with two methods of X-ray diffraction(XRD)and nanoindentation fracture.It was found that the tensile stress occurs in KNN films with small thickness of 1.3μm after all kinds of stresses were neutralized,which is mainly originated from the interaction across grain boundaries.With increasing the thickness to 2.5μm and above it,the residual stress changed from tensile stresses to compressive stresses,and the compressive stress decreased with the thickness increased.These results could explain why a thicker KNN film can show improved electrical properties and the larger the thickness,the better the ferroelectric and piezoelectric properties.	LINGYAN WANG WEI REN PHOI CHIN GOH KUI YAO PENG SHI XIAOQING WU	2012	Journal of Advanced Dielectrics2012，2，4：	0

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