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17篇 您的检索式：作者名="Reorda S"

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		题名	作者	年代	出处	被引量
	1	Fully automatic test program generation for microprocessor cores 显示文摘	Como F Cumani G Reorda M S	2003	Design Automation and Test in Europe Conference and Exhibition2003，，：	1
	2	RT-level ITC'99 benchmarks and first ATPG results 显示文摘	CORNO F REORDA M S SQUILLERO G	2000	Journal Design & Test of Computers IEEE2000，17，3：	1
	3	Identification and classification of single-event upsets in the configuration memory of SRAM- based FPGAs显示文摘	Ceschia M Violante M Reorda M S	2003	IEEE Transactions on Nuclear Science2003，50，6：	1
	4	On-line analysis and perturbation of CAN networks Reorda显示文摘	Reorda M S Violante M	2004	19th IEEE International Symposium2004，10，1013：	1
	5	Automatic test program generation- a case study 显示文摘	Corno F S6nchez E Reorda M S	2004	IEEE Design & Test2004，21，2：	1
	6	Automatic test program generation-a case study显示文摘	Corno F Sánchez E Reorda M S	2004	IEEE Design & Test2004，21，2：	1
	7	Identification and classification of single-event upsets in the configuration memory of SRAM based FPGAs显示文摘	Ceschia M Violante M Reorda M S	2003	IEEE Trans on Nuclear Science2003，50，6：	1
	8	An experiment analysis of the ef- fects of migration in parallel genetic algorithms显示文摘	Rebaudengo M Reorda S	1993	Parallel and Distributed Processing1993，10，2：	1
	9	RT-level ITC'99 Benchmarks and first ATPG results 显示文摘	Corno F Reorda M S Squillero G	2000	IEEE Design and Test of Computers2000，17，3：	1
	10	Automatic test program generation: a case study 显示文摘	Corno F Sanchez E Reorda M S	2004	IEEE Design & Test of Computers2004，21，2：	1
	11	Early, accurate dependability analysis of CAN-Based networked systems显示文摘	Acle J P Reorda M S Violante M	2006	Design & Test of Computers2006，23，1：	1
	12	Automatic test program generation: A case study 显示文摘	Corno F Sanehez E Reorda M S	2004	IEEE Design &Test of Computers2004，21，2：	1
	13	A parallel tester architecture for accelerometer and gyroscope MEMS calibration and test显示文摘	Brasca L M C Bernardi P Reorda M S	2011	Journal of Electronic Testing2011，27，3：	1
	14	RT-level ITC 99 benchmarksand first ATPG results显示文摘	Corno F Reorda M S Squillero G	2000	IEEE Design &Test of Computers2000，17，3：	1
	15	Identification and classification of single-event upsets in the configuration memory of sram-based fpgas 显示文摘	Ceschia M Violante M Reorda M S	2003	IEEE Transactions on Nuclear Sci- ence2003，50，6：	1
	16	Automatic test bench generation for validation of RT-level descriptions: An industrial experience 显示文摘	Corno F Reorda M S Squillero G	2000	Design Automation and Test in Europe Conference and Exhibition2000，，：	1
	17	VEGA: A verification tool based on genetic algorithms 显示文摘	ComoF Reorda M S Squillero G	1998	VLSI in Computers and Processors1998，，：	1

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