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24篇 您的检索式：作者名="SOLTERBECK C"

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	题名	作者	年代	出处	被引量
1	Multiferroic BiFeO3 thin films processed via chemical solution deposition:structural and electrical characterization显示文摘	Lakovlev S Solterbeck C H Kuhnke M et a1		0，，07：	1
2	Surface scanning probe microscopy investigation of solution deposited BiFeO3 thin films显示文摘	Habouti S Solterbeck C Es -Sounia M	2006	Appl Phys Lett2006，88，26：	1
3	Muhiferroic BiFeO3 thin films processed via chemical solution deposition: Structural 显示文摘	IAKOVLEV S SOLTERBECK C H KUHNKE M et al	2005	Applied Physics Letters2005，97，09：	1
4	Multiferroic BiFeO3 thin films processed via chemical solution deposition:structural and electrical characterization显示文摘	Iakovlev S Solterbeck C H Kuhnke M	2005	J Appl Phys2005，97，09：	1
5	显示文摘	Es-Souni M Abed M Solterbeck C H	2002	Materials Science and Engineering2002，94，：	1
6	Rare-Earth Ions Doping Effects on the Optical Properties of Sol-Gel Fabricated PbTiO3 Thin Films显示文摘	Iakovlev S Solterbeck C H Es-Souni M	2004	Thin Solid Films2004，446，1：	1
7	On PbTiO3- (111)-Pt interfacial layers and their X-ray photoelectron spectroscopy signature 显示文摘	HABOUTI S SOLTERBECK C ES-SOUNI M	2008	JAppl Phys2008，104，10：	1
8	显示文摘	lakovlev S Solterbeck C H Kuhnke M	2005	J Appl Phys2005，97，09：	1
9	Multiferroic BiFeO3 thin films processed via chemical solution deposition : Structural and electrical characterization显示文摘	Iakovlev S Solterbeck C H Kuhnke M	2005	J Appl Phys2005，97，09：	1
10	Multiferroic BiFeO3 Thin Films Processed via Chemical Solution Deposition:Structural and Electrical Characterization显示文摘	Iakovlev S Solterbeck C H Kuhnke M	2005	J Appl Phys2005，97，09：	1
11	Surface Scanning Probe Microscopy Investigation of Solution Deposited BiFeO3 Thin Films显示文摘	Habouti S Solterbeck C Es-Souni M	2006	Appl Phys Lett2006，88，26：	1
12	显示文摘	Es-Souni E Abed M Solterbeck C H	2002	Materials Science and Engineering B2002，94，：	1
13	Multiferroic BiFeO3 Thin Films Processed via Chemical Solution Deposi- tion: Structural and Electrical Characterization显示文摘	Lakovlev S Solterbeck C H Kuhnke M	2005	J Appl Phys2005，97，09：	1
14	Multiferroic BiFeO3 thin films processed via chemical solution deposition: structural and electrical characterization 显示文摘	Iakovlev S Solterbeck C H Kuhnke M	2005	J Appl Phys2005，97，：	1
15	Surface scanning probe microscopy investigation of solution deposited BiFeO3 thin films显示文摘	HABOUTI S SOLTERBECK C SOUNIA E M	2006	Appl Phys Lett2006，88，26：	1
16	Multiferroic BiFeO3 thin films processed via chemical solution deposition:structural and electrical characterization显示文摘	IAKOVLEV S SOLTERBECK C H KUHNKE M	2005	J Appl Phys2005，97，09：	1
17	显示文摘	Iakovle S Solterbeck C H Kuhnke M	2005	Appl Phys Lett2005，97，9：	1
18	Surface scanning probe microscopy investigation of solution deposited BiFeOs thin films显示文摘	Habouti S Solterbeck C Es-Souni M	2006	Appl Phys Lett2006，88，26：	1
19	Multiferroic BiFeO3thin films processed via chemical solutiondeposition:Structural and electrical characterization显示文摘	LAKOVLEV S SOLTERBECK C H KUHNKE M	2005	JAppl Phys2005，97，09：	1
20	Dielectric and pyroelectric properties of PZFNT/PZT bimorph thin films显示文摘	IAKOVLEV S SOLTERBECK S C H PIORRA A	2003	Journal of Materials Science : Materials in electrics2003，14，3：	1

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