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15篇 您的检索式：作者名="STEVIE F"

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		题名	作者	年代	出处	被引量
	1	A review of focused ion beam milling techniques for TEM specimen preparation 显示文摘	Giannuzzi L A Stevie F a	1999	Micron1999，30，3：	1
	2	A review of focused ion beam milling techniques for TEM specimen preparation 显示文摘	GIANNUZZI L STEVIE F	1999	Micron1999，30，3：	1
	3	Removal of alkaline impurities in a polysilicon gate structure by phosphorus diffusion 显示文摘	PEARCE C MOORE J STEVIE F	1993	J Electrochem Soc1993，140，：	1
	4	A review of focused ion beam milling technique for TEM specimen reparation 显示文摘	GIANNUZZI L A STEVIE F A	1999	Micron1999，30，：	1
	5	Cyanobacterial blooms in a temperate river-floodplain ecosystem:the importance of hydrological extremes显示文摘	Mihaljevi? M Stevi? F	2011	Aquat Ecol2011，45，：	1
	6	A review of focused ion beam milling technique for TEM specimen reparation显示文摘	Giannuzzi L A Stevie F A	1999	Micron1999，30，：	1
	7	Changes of phytoplankton functional groups in a floodplain lake associated with hydrological perturbations显示文摘	Stevi? F Mihaljevi? M ?poljaric D	2013	Hydrobiologia2013，709，：	1
	8	A review of focused ion beam milling techniques for TEM specimen preparation显示文摘	GIANNUZZIA L A STEVIE F A	1999	Micron1999，30，：	1
	9	Focused ion beam milling and micromanipulation lift-out for site specific cross-section TEM specimen preparation显示文摘	Giannuzzi L A Drown J L Brown S R Irwin R B Stevie F A	1997	Mat Res Soc Proc1997，480，：	1
	10	A review of focused ion beam milling techniques for TEM specimen preparation显示文摘	GIANNUZZI L A STEVIE F A	1999	Micron1999，30，：	1
	11	Secondary ion mass spectrometry induced damage adjacent to analysis craters in silicon显示文摘	Clark M H Jones K S Stevie F A	2002	Journal of Vacuum Science & Technology A2002，20，5：	1
	12	Understanding whisker phenomenon: The driving force for whisker formation显示文摘	XU C ZHANG Y FAN C ABYS J HOPKINS L STEVIE F	2002	CircuiTree2002，15，5：	1
	13	A Review of Focused ion Beam Milling Techniques for TEM Specimen Preparation显示文摘	Giannuzzi L A Stevie F A	1999	Micron1999，30，3：	1
	14	Improved charge neutralization method for depth profiling of bulk insulators using O2+ primary beam on a magnetic sector SIMS instrument 显示文摘	PIVOVAROV A L STEVIE F A GRIFFIS D P	2004	Applied Surface Science2004，，213232：	1
	15	A Review of Focused Ion Beam Milling Technique for TEM Specimen Preparation显示文摘	Giannuzzi L A Stevie F A	1999	Micron1999，30，：	1

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