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31篇 您的检索式:作者名="Sah C T"
    题名 作者 年代 出处 被引量
1Thiosemicarbazide as a Reagent for the Identification of Aldehydes Ketones and Guinones显示文摘 Danies T C 1950Recuetl1950,69,:1
2Directcurrent measurement of oxide and interface traps on oxidized silicon显示文摘NEUGROSCHEL A SAH C T HAN K M 1995IEEE Transaction on Electron Devices1995,42,9:1
3Monitoring interface traps by DCIV method显示文摘CAI J SAH C T 1999IEEE Electron Device Letters1999,20,1:1
4Direct current measurements of oxide and interface traps on oxidized silicon显示文摘Neugroschel A Sah C T Han K M 1995IEEE Trans Electron Devices1995,42,:1
5Thiosemicarbazide as A Reagent for the Identification ofAldehydes Ketones and Guinones显示文摘Peter P T SAH Danies T C 1950Recueko,1950,69,:1
6Ion transport phenomena in insulating films 显示文摘SNOW E H GROVE A S SAH C T 1965Appl Phys1965,36,5:1
7Origin of interface states and oxide charges generated by ionizing radiation显示文摘Sah C T 1976IEEE Trans Nucl Sci1976,23,6:1
8Characteristics of the metal-oxide-semiconductor transistors显示文摘Sah C T 1964IEEE Trans on Electron Devices1964,11,7:1
9Field dependence of two large hole capture cross section in thermal oxide on silicon显示文摘TZOU J J SUN J Y C SAH C T 1983Appl Phys Lett1983,43,8:1
10Influence of sinter basicity (CaO/SiO2)on low and high alumina iron ore sinter quality显示文摘Umadevi T Sah R Mahapatra P C 2014Mineral Processing & Extractive Metallurgy Imm Transactions2014,123,:1
11Transient response of MOS capacitors under localized photoexcitation显示文摘SAH C T FU H S 1974IEEE1974,21,3:1
12Direct-current measurement of oxide and interface traps on oxidizied silicon 显示文摘NEUGROSEHEL A SAH C T HANK M 1995IEEE Trans Elec Dev1995,42,9:1
13Carrier generation and recombination in p-n junctions and p-n junction characteristics 显示文摘Sah C T Noyce R N Shockley W 1957Proc IRE1957,45,9:1
14Gate tunneling currents in ultra-thin oxide metal-oxide-silicon transistors显示文摘CAI J SAH C T 2001Appl Phy2001,89,4:1
15Source to drain resistance beyond pinch-off in metal-oxide-semiconductor transistors (MOST) 显示文摘Reddi V G K Sah C T 1965IEEE Transactions on Electron Devices1965,12,3:1
16Characterization of seleno cysteine methyhransferases from Astragalus species with contrasting selenium accumulation capacity显示文摘Sors T G Martin C P Sah D E 2009The Plant Journal2009,59,1:1
17Directcurrent measurement of oxide and interface traps on oxide silicon 显示文摘Neugroschel A Sah C T Han K M 1995IEEE Trans Elec Dev1995,42,9:1
18Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconductor transistors显示文摘Pao H C Sah C T 1966Solid State Electron1966,9,:1
19The effcets of fixed bulk charge on the characteristics of metal-oxide-semiconductor tran- sistors 显示文摘Sah C T Pao H 1965IEEE Transactions on Electron Devies1965,13,:1
20Effects of diffusion current on characteristics of metal-oxide (insulator)-semiconduc- tor transistors 显示文摘Pao H C Sah C T 1996Solid-state Electronics1996,9,10:1
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