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| 1 | Local electrical charac terization of t wo-dimensional mat erials with functional atomic force microscopy显示文摘Research about two-dimensional (2D) materials is growing exponentially across various scientific and engineering disciplines due to the wealth of unusual physical phenomena that occur when charge transport is confined to a plane. The applications of 2D materials are highly affected by the electrical properties of these mat erials, including curren t dist ribution, surface pot ential, dielectric response, conductivity, perm计tivity, and piezoelectric response. Hence, it is very crucial to characterize these properties at the nanoscale. The Atomic Force Microscopy (AFM)-based techniques are powerful tools that can simultaneously characterize morphology and electrical properties of 2D materials with high spatial resolution, thus being more and more extensively used in this research field. Here, the principles of these AFM techniques are reviewed in detail. After that, their representative applications are further demonstrated in the local characterization of various 2D materials? elcctrical properties. | Sabir Hussain Kunqi Xu Shili Ye Le Lei Xinmeng Liu Rui Xu Liming Xie Zhihai Cheng | 2019 | Frontiers of physics2019，14，3： | 2 |
| 2 | High harmonic exploring on different materials in dynamic atomic force microscopy显示文摘In atomic force microscopy(AFM), high-frequency components consisted in dynamic tip-sample interaction have been recently demonstrated as a promising technique for exploring more extensive material properties. Here we present an exploratory study of high harmonic atomic force microscopy by force-spectroscopy and high harmonic imaging. Since these components are very weak compared to the fundamental response, we firstly designed a high harmonic cantilever by tuning the second order flexural resonance frequency to an integer 6 times of its fundamental mode(i.e. ω_2=6ω_1). Moreover, it is verified that high harmonic can discern extra features than topographies on different samples with amplitude/frequency modulation(AM/FM) dynamic AFM mode. In AM mode, the first resonance amplitude and 6 th harmonic amplitude were discussed. The 6 th harmonic is more sensitive than the first order response. In FM mode, it is noted that the decaying rate of the 6 th harmonic frequency is approximately 6 multiples to the slope of the fundamental frequency shift when the tip approaches to the surface of sample. This non-destructive method was also adopted to investigate the local interlayer coupling and intercalation in the two-dimensional graphene films tentatively. | ZHENG ZhiYue XU Rui YE ShiLi HUSSAIN Sabir JI Wei CHENG Peng LI YanJun SUGAWARA Yasuhiro CHENG ZhiHai | 2018 | Science China(Technological Sciences)2018，61，3： | 1 |
| 3 | Spurious-free dynamic range improvement in a photonic time-stretched analog-to-digital converter based on third-order predistortion显示文摘Spurious-free dynamic range(SFDR)limited by intermodulation distortions is a usually accepted measure for dynamic performance of a photonic time-stretched analog-to-digital converter(ADC).In this paper,SFDR improvement in a photonic time-stretched ADC based on third-order predistortion is proposed.The third-order predistortion is achieved optically within an integrated dual-parallel Mach–Zehnder modulator(DPMZM).The mechanism of SFDR improvement with third-order predistortion in the DPMZM is theoretically analyzed.Compared with a conventional scheme without predistortion,the experimental results show that the SFDR improvement of∼26 dB in the proposed scheme is proved. | Boyu Xu Wulue Lv Jiamu Ye Jinhai Zhou Xiaofeng Jin Xianmin Zhang Hao Chi Shilie Zheng | 2014 | Photonics Research2014，2，5： | 0 |
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