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	题名	作者	年代	出处	被引量
1	Toward a deeper understanding of the availability of series-systems without aging during repairs显示文摘	Winfrid G Schneeweiss	2005	IEEE Trans Reliab2005，54，1：	1
2	A Gamma Wear Process 显示文摘	Abdel - Hameed M	1975	IEEE Trans Reliab1975，24，2：	1
3	Flex crackizag of multilayer ceramic capacitors assembled with Pb-free and tin-lead solders 显示文摘	KEIMASI M AZARIAN M H PECHT M G	2008	IEEE Trans Device Mater Reliab2008，，8：	1
4	Accelerated life testing-step-stress models and data analysis显示文摘	NELSON W B	1980	IEEE Trans Reliab1980，29，1：	1
5	Real-time performance reliability prediction 显示文摘	LU H KOLARIK W J LU S S	2001	IEEE Trans Reliab2001，50，4：	1
6	Study of the effects of multi bit error correction codes on the reliability of memories in the presence of MBUs 显示文摘	REVIRIEGO P MAESTRO J A	2009	IEEE Trans Dev & Mater Reliab2009，9，1：	1
7	Computational complexity of network re-liability analysis显示文摘	BALL M o	1986	IEEE Trans Reliab1986，35，3：	1
8	All opportunity-triggered replacement policy for multiple-unit systems显示文摘	Zheng X	1995	IEEE Trans Reliab1995，44，4：	1
9	Reliability of scrubbing recovery-techniques formemory systems 显示文摘	SALEH A M SERRANO J J PATEL J H	1990	IEEE Trans Reliab1990，39，1：	1
10	Reliability analysis of memories suffering multiple bit upsets 显示文摘	REVIRIEGO P MAESTRO J A CERVANTES C	2008	IEEE Trans Dev : Mater Reliab2008，7，4：	1
11	A linear-time algorithm for comput-ing K-terminal reliability on proper interval graphs显示文摘	LIN Min-sheng	2002	IEEE Trans Reliab2002，51，1：	1
12	The simulation of a new asymmetrical double-gate poly-Si TFT with modified channel conduction mechanism for highly reduced off-state leakage current 显示文摘	Orouji A A Jagadesh K M	2005	IEEE Trans Device Mater Reliab2005，5，4：	1
13	TheRosetta experiment: atmospheric soft error rate testingin differing technology FPGAs 显示文摘	LESEA A DRIMER S FABULA J J	2005	IEEE Trans DevMater Reliab2005，5，3：	1
14	Sequential imperfect preventive maintenance policies显示文摘	Nakagawa T	1988	IEEE Trans Reliab1988，37，3：	1
15	Reliability of scrubbing recovery-techniques for memory systems 显示文摘	SALEH A M SERRANO J J PATEL J H	1990	IEEE Trans Reliab1990，39，1：	1
16	Modeling repairable systems with failure rates that depend on age and maintenance显示文摘	Chan J Shaw L	1993	IEEE Trans Reliab1993，42，4：	1
17	Reliability optimization of series-parallel systems using a genetic algorithm 显示文摘	Coit D W Smith A E	1996	IEEE Trans on Reliab1996，45，：	1
18	Age-dependent models for evaluating risks and costs of surveillance and maintenance of systems显示文摘	Martorell S Munoz A Serradell V	1996	IEEE Trans Reliab1996，45，3：	1
19	Reliability optimization by generalized Lagrangin- function and reduced-gradient methods显示文摘	HWANG C L TILLMAN F A KUO W	1979	IEEE Trans Reliab1979，28，4：	1
20	Optimal reliability design of a system: a new look显示文摘	MISRA K B LJUBOJEVIC M D	1973	IEEE Trans Reliab1973，22，5：	1

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