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29篇 您的检索式：期刊名="International Test Conference"

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	题名	作者	年代	出处	被引量
1	Inhomogeneous cellular atuomata for weighted random pattern generation显示文摘	NEEBEL D J KIME C R	1993	Proc of the IEEE International Test Conference on Desi-gning Testing and Diagnostic1993，1993，：	1
2	A New Extraction Method for BSIM3v3 Model Parameters of RF Silicon MOSFETs 显示文摘	Lee S Yu H K	1999	Microelectronia Test Structures Icmts Proceedings of the International Conference1999，，：	1
3	A parity bit signature for exhaustive testing显示文摘	Akers S N	1988	Proc of IEEE International Test Conference1988，，：	1
4	Analog boundary scan description language(ABSDL) for mixed-signal board test显示文摘	SUPARJO B	2006	IEEE International Test Conference2006，，：	1
5	A method to improve SFDR with random inter- leaved sampling method 显示文摘	TAMBA M SHIMIZU A	2001	ITC International Test Conference2001，18，3：	1
6	March-based RAM diagnosis algorithms for stuck-at and coupling faults显示文摘	LI J F CHENG K L HUANG Ch T	2001	IEEE International Test Conference2001，，：	1
7	Test cube encoding using partial LFSR reseeding显示文摘	C V Krishna Abhijit Jas Nur A Touba	2001	Proceedings of International Test Conference2001，78，18：	1
8	25um CMOS Devices显示文摘	Brain Kruseman Peter Jansesen Victor Zieren Transient Current Testing of 0	1999	IEEE international test conference1999，，：	1
9	When to migrate software testing to the Cloud? 显示文摘	PARVEEN T TILLEY S	2010	Software Testing Verification and Validation Work- shops Third International Conference on2010，2010，：	1
10	Development of a MEMS Testing Methodology显示文摘	Kolpekwar A	1997	IEEE International Test Conference1997，，：	1
11	Advanced mixed signal testing by DSP LOCALIZED tester显示文摘	KOJI KARATE	1991	International Test Conference1991，，3：	1
12	The use of linear models for the efficient and accurate testing of A/D converters显示文摘	CAPOFREDDI P D WOOLY B A	1995	International Test Conference1995，，6：	1
13	Accurate and complete ADC testing显示文摘	SMACK FAST	1989	IEEE International Test Conference1989，，8：	1
14	Integrated Test Solutions and Test Economics forMCMs显示文摘	Kevin Tkornegay and Kaushik Roy	1995	International test conference1995，，：	1
15	Test resource partitioning for SOCs 显示文摘	ANSHUMAN CHANDRA KRISHNENDU CHAKRABARTY	2001	International Test Conference2001，1，：	1
16	UWB DCSK System Design and Simulation显示文摘	LI H SI F F	2009	IEEE International Conference on Test and Measurement2009，，01：	1
17	Electronic chip-in-place test显示文摘	Goel P Mcmahon M T	1982	Proceedings of IEEE International Test Conference1982，，：	1
18	Voorakaranam, et al, Hierarchical Specification-Driven An- alog Fault Modeling for Efficient Fault Simulation and Diagno- sis显示文摘	R	1997	International Test Conference1997，，：	1
19	Interconnect testing with boundary scan 显示文摘	Wagner P T	1987	Proceedings of IEEE International Test Conference1987，，：	1
20	Industrial ScaledAutomated Structural Testing with the Evolutionary Testing Tool显示文摘	Tanja E J Vos Arthur I Baars Felix F Lindlar	2010	icst Third International Conference on Software Testing Verificationand Validation2010，2010，：	1

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