维普期刊资源整合服务平台（V6.5）

维普中文期刊产品整合服务

1篇 您的检索式：作者名="Giovanni Cotella"

选中清除导出查看参考文献查看引证文献引用追踪共1页首页上一页第1页下一页末页 /1 跳转

		题名	作者	年代	出处	被引量
	1	Significant Lifetime Enhancement in QLEDs by Reducing Interfacial Charge Accumulation via Fluorine Incorporation in the ZnO Electron Transport Layer显示文摘ZnO nanoparticles are widely used for the electron transport layers(ETLs)of quantum dots light emitting devices(QLEDs).In this work we show that incorporating fluorine(F)into the ZnO ETL results in significant enhancement in device electroluminescence stability,leading to LT50 at 100 cd m^(−2) of 2,370,000 h in red QLED,47X longer than the control devices.X-ray photo-electron spectroscopy,time-of-flight secondary ion mass spectroscopy,photoluminescence and electrical measurements show that the F passivates oxygen vacancies and reduces electron traps in ZnO.Transient photoluminescence versus bias measurements and capacitance-voltage-luminance measurements reveal that the CF4 plasma-treated ETLs lead to increased electron concentration in the QD and the QD/hole transport layer interface,subsequently decreasing hole accumulation,and hence the higher stability.The findings provide new insights into the critical roles that optimizing charge distribution across the layers play in influencing stability and present a novel and simple approach for extending QLED lifetimes.	Dong Seob Chung Tyler Davidson-Hall Giovanni Cotella Quan Lyu Peter Chun Hany Aziz	2022	Nano-Micro Letters2022，14，12：	1

返回顶部每页显示：

共1页首页上一页第1页下一页末页 /1 跳转

goolge学术搜索-维普

网站首页 | 关于我们 | 联系我们 | 产品服务 | 客服中心 | 广告服务 | 版权声明 | 网站联盟 | 友情链接 | 售卡网点

版权所有© 渝B2-20050021-1　渝公网安备 50019002500403号　违法和不良信息举报中心

互联网出版许可证新出网证(渝)字10号全国400电话 - 免长途话费