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8篇 您的检索式:作者名="SHEN Dongjun"
    题名 作者 年代 出处 被引量
1The first pulsar discovered by FAST显示文摘To assist with the commissioning [1] of the Five-hundredmeter Aperture Spherical radio Telescope (FAST), we performed a pulsar search, with the primary goal of developing and testing the pulsar data acquisition and processing pipelines. We tested and used three pipelines, two (Pl and P2 hereafter) searched for the periodic signature of pulsars whereas the other one was used to search for bright single pulses (P3 hereafter).Lei Qian ZhiChen Pan Di Li George Hobbs WeiWei Zhu Pei Wang ZhiJie Liu YouLing Yue Yan Zhu HongFei Liu DongJun Yu JingHai Sun Peng Jiang GaoFeng Pan Hui Li HengQian Gan Rui Yao XiaoYao Xie Fernando Camilo Andrew Cameron Lei Zhang Shen Wang FAST Collaboration 2019Science China(Physics,Mechanics & Astronomy)2019,62,5:3
2Cu 2 O/Cu/TiO 2 nanotube Ohmic heterojunction arrays with enhanced photocatalytic hydrogen production activity显示文摘Zhonghua Li Jiawen Liu Dongjun Wang Yuan Gao Jun Shen 2012International Journal of Hydrogen Energy2012,,8:1
3Cu 2 O/Cu/TiO 2 nanotube Ohmic heterojunction arrays with enhanced photocatalytic hydrogen production activity显示文摘Zhonghua Li Jiawen Liu Dongjun Wang Yuan Gao Jun Shen 2012International Journal of Hydrogen Energy2012,,:1
4The effect of cooling rate on the wear performance of a ZrCuAlAg bulk metallic glass显示文摘Yongjiang Huang Hongbo Fan Dongjun Wang Yu Sun Fangyu Liu Jun Shen Jianfei Sun J. Mi 2014Materials and Design2014,,:1
5Microstructure and mechanical properties of Al-Ni-Ce amorphous matrix composites enhanced with Ti-based glassy particles prepared by powder metallurgy显示文摘WANG Dongjun WEI Xianshun SHEN Jun 2014Mater Lett2014,133,:1
6The effects of annealing on the microstructure and the dynamic mechanical strength of a ZrCuNiAl bulk metallic glass显示文摘Yongjiang Huang Wei Zheng Hongbo Fan Dongjun Wang Jun Shen J. Mi 2013Intermetallics2013,,:1
7Effect of Temperature on Single Event Upsets of TFT SRAM and Its Error Rate Prediction显示文摘Based on Beijing HI-13tandem accelerator and the developed sample temperature measurement and control systems,heavy-ion broadbeam and microbeam experiments of 0.15μm commercial thin film transistor(TFT)structure,65nm triple-well and twin-well bulk CMOS technique SRAMs have been carried out,andCAI Li LIU Jiancheng QIN Yingcan GUO Gang LI Lili SHI Shuting HUI Ning FAN Hui SHEN Dongjun HE Anlin 2017Annual Report of China Institute of Atomic Energy2017,,1:0
8Proton Induced Single Event Upsets Test and Soft Error Rate Prediction of nm Device显示文摘Based on the Beijing HI-13tandem accelerator proton beam source and its technical improvements,2-15 MeV low energy proton beam were obtained.SEUs test of low energy protons was carried out on a commercial 65nm4M×18bit SRAM.Low energy proton,highenergy proton and heavy ion induced SER,differ-HE Anlin GUO Gang SHEN Dongjun LIU Jiancheng SHI Shuting 2017Annual Report of China Institute of Atomic Energy2017,,1:0
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