| 5 | AN ADVANCED TECHNIQUE FOR THE TEXTURES MEASUREMENTAND ANALYSIS FOR THE MULTILAYER MATERIALS显示文摘In view of being difficult to find a non-oriented multilayer specimen, the precise defocusing correction become a particular obstacle of quantitative texture analyszs of the multzlayer. A new method is employed in this paper for comcting the eoperzment data. And a theoretical calculation for the defocus curre is proposed thinking about both thc dtherent film thickness and the penetration depth of the incident beam in the films. A critical value jor the defocusing cormction in the film is alsi cinsidered. This new tcchnique is applied to the Zn-Cu multilayer for which the quantitative texture analysis is completed by the modified maxitnum entropy tnethod. | Y. D. Liu G. Wang C.S. He Y.D. Whng and J.Z. Xu (Department of Materials Science and Engineering, Northeastern University, Shenyang 110006, China) | 1999 | Acta Metallurgica Sinica(English Letters)1999，12，6： | 0 |
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