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4篇 您的检索式：作者名="G.F. Ding"

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		题名	作者	年代	出处	被引量
	1	Thermocline stability criterions in single-tanks of molten salt thermal energy storage显示文摘	Frank G.F. Qin Xiaoping Yang Zhan Ding Yuanzhi Zuo Youyan Shao Runhua Jiang Xiaoxi Yang	2012	Applied Energy2012，，：	1
	2	Criteria for performance improvement of a molten salt thermocline storage system显示文摘	Xiaoping Yang Xiaoxi Yang Jing Ding Youyuan Shao Frank G.F. Qin Runhua Jiang	2012	Applied Thermal Engineering2012，，：	1
	3	EFFECT OF HEAT TREATMENTS ON THE MICROSTRUCTURE AND TRANSFORMATION CHARACTERISTICS OF TiNiPd SHAPE MEMORY ALLOY THIN FILMS显示文摘Microstructure and phase transformation behaviors of the film annealed at different tempera- tures were studied by X-ray diffractometry (XRD), transmission electron microscopy and differ- ential scanning calorimeter (DSC). Also tensile tests were examined. For increasing annealed temperature, multiple phase transformations, transformations via a B19-phase or direct marten- site/austenite transformtion are observed. The TiNiPd thin film annealed at 750°C had relatively uniform martensite/austenite transformtion and shape memory effect. Martensite/austenite trans- formtion was also found in strain-temperature curves. Subsequent annealing at 450°C had minor effect on transformation temperatures of Ti-Ni-Pd thin films but resulted in more uniform trans- formation and improved shape memory effect.	C.C. Zhang C.S. Yang G.F. Ding S. Q. Qian J.S. Wu	2005	Acta Metallurgica Sinica(English Letters)2005，18，6：	0
	4	MICROBRIDGE TESTING OF YOUNG'S MODULUS AND RESIDUAL STRESS OF NICKEL FILM ELECTROPLATED ON SILICON WAFER显示文摘Microbridge testing is used to measure the Young's modulus and residual stresses of metallic films. Nickel film microbridges with widths of several hundred microns are fabricated by Microelectromechanical Systems. In order to measure the mechanical properties of nickel film microbridges, special shaft structure is designed to solve the problem of getting the load-deflection curves of metal film microbridge by Nanoindenter XP system with normal Berkovich probe. Theoretical analysis of the microbridge load-deflection curve is proposed to evaluate the Young's modulus and residual stress of the films simultaneously. The calculated results based on the experimental measurements show that the average Young's modulus and residual stress are around 190GPa and 175MPa respectively, while the Young's modulus measured by Nanohardness method on nickel film with silicon substrate is 186.8±7.34GPa.	Y.Zhou C.S.Yang J.A. Chen G.F. Ding L. Wang M.J Wang Y.M Zhang T.H Zhang	2004	Acta Metallurgica Sinica(English Letters)2004，17，3：	0

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