维普中文期刊产品整合服务
2篇 您的检索式:作者名="NieRui"
    题名 作者 年代 出处 被引量
1RBS Analysis of Damage Evolution in Helium-implanted 4H-SiC显示文摘The understanding of mechanisms of damage evolution in silicon carbide bombarded with energetic heliumions is important for the use of this material in future fusion reactors. One interesting result from our recentTEM study of defect production in helium-implanted 4H-SiC is the rather high dose threshold for the forma-tion of nanometric helium bubbles This may supply an explanation for the observed defect depleted zone near the surface of silicon carbide. While the defect depleted zone is believed to be the reason of the high resistance of SiC nanocrystals and fibers to heavy irradiation.ZhangChonghong SongYin DuanJinglai SunYoumei MaHongji NieRui ShenDingyu 2003近代物理研究所和兰州重离子加速器实验室年报:英文版2003,,1:0
2Defect Accumulation and Its Effect on Photoluminescence in GaN Bombarded with Low-energy Heavy Ions显示文摘Gallium Nitride (GaN) is an important material for the development of novel short-wave-length photonicdevices or high-frequency, high-power electronic devices. Ion implantation/irradiation was proved to be an effective method to modify the physical properties of the material. In the present work, we studied the dependence of damage accumulation on irradiation dose and temperature and the corresponding effects on photolumines cence character of the material. Specimens of GaN (n-type doping, (0001) on axis) were irradiated withZhangChonghong SongYin DuanJinglai SunYoumei YaoCunfeng MaHongji NieRui T.Shibayama HongChen 2003近代物理研究所和兰州重离子加速器实验室年报:英文版2003,,1:0
返回顶部 每页显示:
共1页 首页 上一页 第1页 下一页 末页 /1 跳转

网站首页 | 关于我们 | 联系我们 | 产品服务 | 客服中心 | 广告服务 | 版权声明 | 网站联盟 | 友情链接 | 售卡网点

版权所有© 渝B2-20050021-1 渝公网安备 50019002500403号 违法和不良信息举报中心

互联网出版许可证 新出网证(渝)字10号 全国400电话 - 免长途话费